NASA NTRS · 19850000488
Measuring Thermoelectric Properties Automatically
Abstract
Microcomputer-controlled system speeds up measurements of Hall voltage, Seebeck coefficient, and thermal diffusivity in semiconductor compounds for thermoelectric-generator applications. With microcomputer system, large data base of these parameters gathered over wide temperature range. Microcomputer increases measurement accuracy, improves operator productivity, and reduces test time.
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Chmielewski, A., Wood, C.. 1986-03-01. Measuring Thermoelectric Properties Automatically. https://ntrs.nasa.gov/citations/19850000488
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