NASA NTRS ยท 19850047407
A thin film strain transducer
Abstract
A device has been developed for the purpose of measuring longitudinal strain in thin polyethylene films. This paper describes the design, development, calibration, and application of this unique transducer in a variety of low temperature environments. This thin, ring-shaped device has a low effective modulus so as not to interfere with the strain that would naturally occur in a thin film. It has a standard 350 ohm impedance which is compatible with most available bridge balance, amplification, and telemetry instrumentation. This transducer has been successfully used for viscoelastic material characterization experiments in the laboratory, as well as in flight measurements of strain on the surface of scientific balloons during inflation, launch, ascent, and float.
Keep this discovery
Explore connections, maps & timelines
Rand, J. L.. 1983-01-01. A thin film strain transducer. https://ntrs.nasa.gov/citations/19850047407
Cite the original work for its findings. Save a collection to share your selection of sources.