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NASA NTRS · 19850047411

Closed-loop strain controlled testing at elevated temperatures with a non-contacting gage

Abstract

Normal strains were measured over a 100 micron gage length at a distance of 50 microns from the edge of a notch using a non-contacting, laser-based interferometric technique. Tests were performed at 600 C under direct strain control from this interferometric 'micro-gage'. A minicomputer system, that produced a voltage analog of strain as a final output, controlled the strain measuring apparatus. This analog output was used directly as the feedback signal to a closed-loop, electrohydraulic mechanical test system. This allowed both strain rate and strain amplitude to be controlled at the notch root of the specimen.

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BibTeXRIS

Martin, J. F., Schultz, B. E.. 1983-01-01. Closed-loop strain controlled testing at elevated temperatures with a non-contacting gage. https://ntrs.nasa.gov/citations/19850047411

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