Segmented testing

Abstract

The fraction of faults detected for a digital network is frequently high for the first few input combinations applied out of a set of test vectors. When the particular ordering of test patterns does not appreciably change the shape of the coverage curve, there appears to be an advantage to splitting the test into segments which are applied at different times. It is shown that the expected time to error detection and the probability of an undetected double error can be reduced. The amount of reduction is dependent on the shape of the fault coverage curve. It is conjectured that such a reduction can be obtained for VLSI networks.