NASA NTRS · 19860019921
Defect characterization of silicon dendritic web ribbons
Abstract
Progress made in the study of defect characterization of silicon dendritic web ribbon is presented. Chemical etching is used combined with optical microscopy, as well as the electron beam induced current (EBIC) technique. Thermal annealing effect on carrier lifetime is examined.
Keep this discovery
Explore connections, maps & timelines
Cheng, L. J.. 1985-06-01. Defect characterization of silicon dendritic web ribbons. https://ntrs.nasa.gov/citations/19860019921
Cite the original work for its findings. Save a collection to share your selection of sources.