NASA NTRS · 19860032548
Residual stresses of thin, short rectangular plates
Abstract
The analysis of the residual stresses in thin, short rectangular plates is presented. The analysis is used in conjunction with a shadow moire interferometry technique by which residual stresses are obtained over a large spatial area from a strain measurement. The technique and analysis are applied to a residual stress measurement of polycrystalline silicon sheet grown by the edge-defined film growth technique.
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Andonian, A. T., Danyluk, S.. 1985-12-01. Residual stresses of thin, short rectangular plates. https://ntrs.nasa.gov/citations/19860032548
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