NASA NTRS · 19870030712
Single event upset immune integrated circuits for Project Galileo
Abstract
Tests showed that bipolar chips in the attitude control computer of the Galileo spacecraft would likely cause catastrophic mission failure due to single particle upset. This paper describes the design and testing of CMOS replacements which are speed compatible with the bipolar parts and are immune to upset by 165-MeV krypton ions.
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Giddings, A. E., Hewlett, F. W., Treece, R. K., Nichols, D. K., Smith, L. S., Zoutendyk, J. A.. 1985-12-01. Single event upset immune integrated circuits for Project Galileo. https://ntrs.nasa.gov/citations/19870030712
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