NASA NTRS · 19870032451
Correspondence between AXAF TMA X-ray performance and models based upon mechanical and visible light measurements
Abstract
The AXAF Technology Mirror Assembly (TMA) was characterized prior to X-ray testing by properties measured mechanically or with visible light; these include alignment offsets, roundness and global-axial-slope errors, axial-figure errors with characteristic lengths greater than about five mm, and surface roughness with scale lengths between about 0.005 and 0.5 mm. The X-ray data of Schwartz et al. (1985) are compared with predictions based upon the mechanical and visible light measurements.
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Van Speybroeck, L., Mckinnon, P. J., Murray, S. S., Primini, F. A., Schwartz, D. A., Zombeck, M. V., Dailey, C. C., Reily, J. C., Weisskopf, M. C., Wyman, C. L.. 1986-01-01. Correspondence between AXAF TMA X-ray performance and models based upon mechanical and visible light measurements. https://ntrs.nasa.gov/citations/19870032451
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