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NASA NTRS · 19880015559

Noncontact temperature pattern measuring device

Abstract

This invention relates to a noncontact imagine pyrometer system for obtaining the true temperature image of a given substance in a contactless fashion without making assumptions about localized emissivity of the substance or the uniformity of the temperature distribution. Such a contactless temperature imaging system has particular application in the study and production of many materials where the physical contact required to make a conventional temperature measurement drastically effects or contaminates the physical process being observed. Two examples where accurate temperature profiles are of critical interest are: (1) the solid-liquid phase change interface in the production of electronic materials and (2) metastable materials in the undercooling region. The apparent novelty resides in the recognition that an active pyrometer system may be advantageously adapted to perform contactless temperature imaging so that an accurate temperature profile can be obtained.

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BibTeXRIS

Elleman, D. D., Allen, J. L., Lee, M. C.. 1987-11-12. Noncontact temperature pattern measuring device. https://ntrs.nasa.gov/citations/19880015559

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