NASA NTRS · 19900000003
Calculating Second-Order Effects in MOSFET's
Abstract
Collection of mathematical models includes second-order effects in n-channel, enhancement-mode, metal-oxide-semiconductor field-effect transistors (MOSFET's). When dimensions of circuit elements relatively large, effects neglected safely. However, as very-large-scale integration of microelectronic circuits leads to MOSFET's shorter or narrower than 2 micrometer, effects become significant in design and operation. Such computer programs as widely-used "Simulation Program With Integrated Circuit Emphasis, Version 2" (SPICE 2) include many of these effects. In second-order models of n-channel, enhancement-mode MOSFET, first-order gate-depletion region diminished by triangular-cross-section deletions on end and augmented by circular-wedge-cross-section bulges on sides.
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Benumof, Reuben, Zoutendyk, John A., Coss, James R.. 1990-01-01. Calculating Second-Order Effects in MOSFET's. https://ntrs.nasa.gov/citations/19900000003
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