NASA NTRS · 19900000145
Forward Bias Inhibits Single-Event Upsets
Abstract
Bipolar integrated circuits more resistant to ionizing radiation. Tests show resistance of bipolar integrated logic or memory circuit by single-event upsets increased by imparting forward bias to diode constituted by buried layer of substrate and collector.
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Zoutendyk, John A.. 1990-04-01. Forward Bias Inhibits Single-Event Upsets. https://ntrs.nasa.gov/citations/19900000145
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