An interferometric strain-displacement measurement system

Abstract

A system for measuring the relative in-plane displacement over a gage length as short as 100 micrometers is described. Two closely spaced indentations are placed in a reflective specimen surface with a Vickers microhardness tester. Interference fringes are generated when they are illuminated with a He-Ne laser. As the distance between the indentations expands or contracts with applied load, the fringes move. This motion is monitored with a minicomputer-controlled system using linear diode arrays as sensors. Characteristics of the system are: (1) gage length ranging from 50 to 500 micrometers, but 100 micrometers is typical; (2) least-count resolution of approximately 0.0025 micrometer; and (3) sampling rate of 13 points per second. In addition, the measurement technique is non-contacting and non-reinforcing. It is useful for strain measurements over small gage lengths and for crack opening displacement measurements near crack tips. This report is a detailed description of a new system recently installed in the Mechanisms of Materials Branch at the NASA Langley Research Center. The intent is to enable a prospective user to evaluate the applicability of the system to a particular problem and assemble one if needed.