A modified equivalent-width technique for diode-laser line strength measurements

Abstract

A modified equivalent-width method is introduced that improves the accuracy of spectral line strength measurements using diode lasers. This method differs from the standard method in that no attempt is made to calculate the true equivalent width in order to determine the line strength. Instead, the line strength is derived directly from a measurement of the area under the line close to the line center and ignore the normal correction terms. Tests with actual spectra and simulations indicate that this method is accurate to better than 1 percent with lines broadened by up to 50 percent by the laser instrument function.