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NASA NTRS · 19910061164

Microanalyses of extended-test xenon hollow cathodes

Abstract

Four hollow cathodes have been examined using boroscopy, scanning electron microscopy, energy dispersive X-ray analysis, and X-ray diffraction analysis to characterize the life-limiting phenomena that resulted from their extended operation. The first pair of cathodes was operated for approximately 500 h in an ion thruster simulator at a 5.0 kW-equivalent power level using different cathode activation and propellant feed-system procedures. The second pair of cathodes was the main discharge cathode and neutralizer cathode from an ion thruster which have completed an 89-hour life-test at a 5.5 kW power level. The greatest change to the cathode condition was found to be removal of refractory metals, primarily tungsten, and their subsequent deposition on other cathode surfaces. Barium tungstate and barium molybdate were also found in all four cathodes. Criteria for improved cathode longevity and discharge operation are proposed for use in hollow cathode and full thruster testing facilities.

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BibTeXRIS

Verhey, Timothy R., Patterson, Michael J.. 1991-06-01. Microanalyses of extended-test xenon hollow cathodes. https://ntrs.nasa.gov/citations/19910061164

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