NASA NTRS · 19930000018
More About Laser Scanner Tests For Single-Event Upsets
Abstract
Two reports describe preliminary theoretical and experimental studies based on method described in "Laser Scanner Tests For Single-Event Upsets" (NPO-18216). Laser-scan and heavy-ion data found correlated within factor of two. Method of testing for single-event upsets intended to overcome disadvantages of, complement, and/or substitute for more-expensive cyclotron-testing method, which does not provide spatial resolution.
Keep this discovery
Explore connections, maps & timelines
Kim, Quiesup, Edmonds, Larry D., Zoutendyk, John A., Schwartz, Harvey R.. 1993-01-01. More About Laser Scanner Tests For Single-Event Upsets. https://ntrs.nasa.gov/citations/19930000018
Cite the original work for its findings. Save a collection to share your selection of sources.