NASA NTRS · 19940000122
Measuring Roughnesses Of Optical Surfaces
Abstract
Report discusses use of scanning tunneling microscopy and atomic force microscopy to measure roughnesses of optical surfaces. These techniques offer greater spatial resolution than other techniques. Report notes scanning tunneling microscopes and atomic force microscopes resolve down to 1 nm.
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Coulter, Daniel R., Al-Jumaily, Gahnim A., Raouf, Nasrat A., Anderson, Mark S.. 1994-02-01. Measuring Roughnesses Of Optical Surfaces. https://ntrs.nasa.gov/citations/19940000122
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