NASA NTRS · 19950065248
Optoelectronic Instruments For Analysis Of Surface Defects
Abstract
Family of portable optoelectronic instruments developed to facilitate inspection of surface flaws like gouges, scratches, raised metal, and dents on large metal workpieces subject to surface-finish requirements. Instrument brought to workpiece and semiautomatically makes electronic record of three-dimensional shape of flaw. Entire inspection process takes only minutes. Prototype instrument includes structured-light microscope. Concept involves projection of known pattern of light onto surface inspected. Topography of surface determined from distortion of pattern as viewed through instrument.
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Collins, J. David, Mueller, Robert P., Davis, Richard M., Gleman, Stuart M., Hallberg, Carl G., Thayer, Stephen W., Thompson, David L., Thompson, James E.. 1995-02-01. Optoelectronic Instruments For Analysis Of Surface Defects. https://ntrs.nasa.gov/citations/19950065248
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