NASA NTRS · 19960021854
Compiled Data On Single-Event Effects Caused By Heavy Ions
Abstract
Report presents test data on susceptibility of new set of digital integrated circuits and other semiconductor products to single-event effects (soft errors and latchups) caused by heavy ions incident at high energies. Data used to develop generalizations for protecting electronic equipment from single-event effects. In some cases, tested parts selected as candidates for use in specific applications.
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Nichols, Donald K., Coss, James R., Schwartz, Harvey R.. 1996-04-01. Compiled Data On Single-Event Effects Caused By Heavy Ions. https://ntrs.nasa.gov/citations/19960021854
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