NASA NTRS · 19960045751
Two-Color Laser Speckle Shift Strain Measurement System
Abstract
A two color laser speckle shift strain measurement system based on the technique of Yamaguchi was designed. The dual wavelength light output from an Argon Ion laser was coupled into two separate single-mode optical fibers (patchcords). The output of the patchcords is incident on the test specimen (here a structural fiber). Strain on the fiber, in one direction, is produced using an Instron 4502. Shifting interference patterns or speckle patterns will be detected at real-time rates using 2 CCD cameras with image processing performed by a hardware correlator. Strain detected in fibers with diameters from 21 microns to 143 microns is expected to be resolved to 15 mu epsilon. This system was designed to be compact and robust and does not require surface preparation of the structural fibers.
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Tuma, Margaret L., Krasowski, Michael J., Oberle, Lawrence G., Greer, Lawrence C., III, Spina, Daniel, Barranger, John. 1996-08-01. Two-Color Laser Speckle Shift Strain Measurement System. https://ntrs.nasa.gov/citations/19960045751
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