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NASA NTRS · 19960047680

High Temperature Testing with Sapphire Fiber White-Light Michelson Interferometers

Abstract

In the design of new aerospace materials, developmental testing is conducted to characterize the behavior of the material under severe environmental conditions of high stress, temperature, and vibration. But to test these materials under extreme conditions requires sensors that can perform in harsh environments. Current sensors can only monitor high temperature test samples using long throw instrumentation, but this is inherently less accurate than a surface mounted sensor, and provides no means for fabrication process monitoring. A promising alternative is the use of sapphire optical fiber sensors. Sapphire is an incredibly rugged material, being extremely hard (9 mhos), chemically inert, and having a melting temperature (over 2000 C). Additionally, there is a extensive background of optical fiber sensors upon which to draw for sapphire sensor configurations.

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Barnes, A., Pedrazzani, J., May, R., Murphy, K., Tran, T., Coate, J.. 1996-03-01. High Temperature Testing with Sapphire Fiber White-Light Michelson Interferometers. https://ntrs.nasa.gov/citations/19960047680

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