NASA NTRS · 19990103094
Broadband Infrared Antireflection Structured Silicon Surfaces
Abstract
Silicon and germanium are materials often used for infrared (IR) windows and optical elements. However they have a very high index of refraction, in the order of three to four, which causes large reflection losses on each surface. These losses are especially high under large angles of incidence which are often desirable if signals are faint and fast optics are to be used. Solid antireflection coatings are either not available because materials with appropriate index of refraction do not exist, or their use is limited to a small wavelength range and small angles of incidence. We will present the status of our work to calculate, create, and test the performance of graded structures in Si to reduce its surface reflection. The structures are expected to work over the very broad wavelength range of 10 micron to 1000 micron and a wide range of angle of incidence. We.have identified several high aspect ratio MEMS process techniques to create the structures and have done 3D electromagnetic modeling, which predicts significant effects. Measurements on different samples have validated our modeling.
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Stewart, Kenneth, Fettig, Rainer, Allen, Christine, Larocque, Jennifer. 1999-01-01. Broadband Infrared Antireflection Structured Silicon Surfaces. https://ntrs.nasa.gov/citations/19990103094
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