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NASA NTRS · 20000023195

Current Radiation Issues for Programmable Elements and Devices

Abstract

The purpose of this presentation is to discuss the COTS performance, clock upset / single event transient, device configuration upset, antifuse hardening, heavy ion SEU, total dose, proton sensitivities, latchup, and additional information and data.

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BibTeXRIS

Katz, Richard, LaBel, K., Reed, R., Wang, J. J., Cronquist, B., McCollum, J., Paolini, W., Sin, B., Koga, R.a, Crain, S., Brown, R., Scott, T.. 1998-01-01. Current Radiation Issues for Programmable Elements and Devices. https://ntrs.nasa.gov/citations/20000023195

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