NASA NTRS · 20060028712
Single-event upset in advanced commercial power PC microprocessors
Abstract
Single-event upset from heavy ions in measured for advanced commercial microprocessors, comparing upset sensitivity in registers and d-cache for several generations of devices. Multiple-bit upsets and asymmetry in registers upset cross sections are also discussed.
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Irom, F., Farmanesh, F., Swift, G. M., Johnston, A. H.. 2003-07-21. Single-event upset in advanced commercial power PC microprocessors. https://ntrs.nasa.gov/citations/20060028712
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