NASA NTRS · 20060028851
Modeling defect trends for iterative development
Abstract
The Employment of Defects (EoD) approach to measuring and analyzing defects seeks to identify and capture trends and phenomena that are critical to managing software quality in the iterative software development lifecycle at JPL.
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Powell, J. D., Spanguolo, J. N.. 2003-06-17. Modeling defect trends for iterative development. https://ntrs.nasa.gov/citations/20060028851
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