NASA NTRS · 20060031419
Assessing application vulnerability to radiation-induced SEUs in memory
Abstract
One of the goals of the Remote Exploration and Experimentation (REE) project at JPL is to determine how vulnerable applications are to single event upsets (SEUs) when run in low radiation space environments using commercial-off-the-shelf (COTS) components.
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Springer, P. L.. 2001-04-01. Assessing application vulnerability to radiation-induced SEUs in memory. https://ntrs.nasa.gov/citations/20060031419
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