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NASA NTRS · 20060031651

Assessing application vulnerability to radiation-induced SEUs in RAM

Springer, P. L.
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radiation SEU software vulnerability

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Springer, P. L.. 2001-06-01. Assessing application vulnerability to radiation-induced SEUs in RAM. https://ntrs.nasa.gov/citations/20060031651

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NASA NTRS2001

Assessing application vulnerability to radiation-induced SEUs in memory

One of the goals of the Remote Exploration and Experimentation (REE) project at JPL is to determine how vulnerable applications are to single event upsets (SEUs) when run in low radiation space environments using commercial-off-the-shelf (COTS) components.

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