NASA NTRS · 20060032488
Reliability Challenges in Emerging IC Metallization Technologies
Abstract
Submicron metallization has been a mixed blessing.
Explore related subjects
Keep this discovery
Explore connections, maps & timelines
Lloyd, J.. 2000-03-20. Reliability Challenges in Emerging IC Metallization Technologies. https://ntrs.nasa.gov/citations/20060032488
Cite the original work for its findings. Save a collection to share your selection of sources.