Atomic Force Microscope for Planetary Applications

Pike, W.; Hecht, M.; Akiyanna, T.; Gautsch, S.; Staufer, U.; Rooij, N. de; Niedermann, P.; Howard, L.; Muller, D.; Tonin, A.; Hidber, H.

NASA NTRS · 20060033008

Atomic Force Microscope for Planetary Applications

Pike, W.·Hecht, M.·Akiyanna, T.·Gautsch, S.·Staufer, U.·Rooij, N. de·Niedermann, P.·Howard, L.·Muller, D.·Tonin, A.·Hidber, H.

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Pike, W., Hecht, M., Akiyanna, T., Gautsch, S., Staufer, U., Rooij, N. de, Niedermann, P., Howard, L., Muller, D., Tonin, A., Hidber, H.. 2000-06-06. Atomic Force Microscope for Planetary Applications. https://ntrs.nasa.gov/citations/20060033008

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