Search NASASearch

NASA NTRS · 20060043627

Radiation effects on microelectronics and future space missions

Abstract

This paper briefly reviews the three basic radiation effect mechanisms, and how they interrupt the functionality of currently available non-volatile memory technologies. This paper also presents a very general overview of the radiation environments expected in future space exploration missions. Unfortunately, these environments will be very harsh, from a radiation standpoint, and thus a significant effort is required to develop non-volatile technologies that will meet future mission requirements.

Explore related subjects

Keep this discovery

Explore connections, maps & timelines

BibTeXRIS

Patterson, Jeffrey D.. 2003-11-12. Radiation effects on microelectronics and future space missions. https://ntrs.nasa.gov/citations/20060043627

Cite the original work for its findings. Save a collection to share your selection of sources.

KEEP EXPLORING

Related reports

NASA Electronic Parts and Packaging (NEPP) Program: Overview and Technology Focus Areas - Responsive Technology Assurance for Civil Space

NASA Electronic Parts and Packaging (NEPP) Program Overview and Technology Highlights – The NEPP Program provides NASA's leadership for developing and maintaining guidance for the screening, qualification, test, and reliable use of electrical, electronic, and electromechanical parts by NASA, in collaboration with other government agencies and industry. The NASA Electronic Parts Assurance Group (NEPAG) is a core portion of NEPP. This presentation highlights key focus areas for 2019.

radiation effects

Recent Advances and Future Challenges in Risk-Based Radiation Engineering

We cover a top-level introduction to hardness assurance (HA) from a robotic space system perspective, starting at the piece-part level. We discuss error sources inherent to presently-accepted HA practices and why they cause us to be risk-averse. We conclude by reviewing current proposals that move towards more risk-tolerant system design approaches as well as future challenges that will require these advanced techniques.

radiation effects