NASA NTRS · 20060044389
Preliminary low temperature tests of a digital signal processor
Abstract
This paper describes an initial experiment performed to assess the electrical behavior of the Innovative Integration board containing a Digital Signal Processor (DSP) with its JTAG (Blackhawk) connector at low temperatures. The objective of the experiment is to determine the lowest temperature at which the DSP can operate. The DSP was tested at various low-temperatures and a Genetic Algorithm was used as the DSP test program.
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Zebulum, Ricardo S., Ramesham, Rajeshuni, Stoica, Adrian, Keymeulen, Didier, Daud, Taher, Sekanina, Lukas. 2005-02-21. Preliminary low temperature tests of a digital signal processor. https://ntrs.nasa.gov/citations/20060044389
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