NASA NTRS · 20060046168
Reliability and qualification of advanced microelectronics for space applications
Abstract
This paper provides a discussion of the subject and an approach to establish a reliability and qualification methodology to facilitate the utilization of state-of-the-art advanced microelectronic devices and structures in high reliability applications.
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Kayali, S.. 2003-01-01. Reliability and qualification of advanced microelectronics for space applications. https://ntrs.nasa.gov/citations/20060046168
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