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NASA NTRS · 20090014087

Microdose Induced Data Loss on Floating Gate Memories

Guertin, Steven M.·Nguyen, Duc M.·Patterson, Jeffrey D.
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Abstract

Heavy ion irradiation of flash memories shows loss of stored data. The fluence dependence is indicative of microdose effects. Other qualitative factors identifying the effect as microdose are discussed. The data is presented, and compared to statistical results of a microdose target-based model.

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BibTeXRIS

Guertin, Steven M., Nguyen, Duc M., Patterson, Jeffrey D.. 2006-12-01. Microdose Induced Data Loss on Floating Gate Memories. https://ntrs.nasa.gov/citations/20090014087

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