NASA NTRS · 20120009206
A Robust Strategy for Total Ionizing Dose Testing of Field Programmable Gate Arrays
Abstract
We present a novel method of FPGA TID testing that measures propagation delay between flip-flops operating at maximum speed. Measurement is performed on-chip at-speed and provides a key design metric when building system-critical synchronous designs.
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Wilcox, Edward, Berg, Melanie, Friendlich, Mark, Lakeman, Joseph, KIm, Hak, Pellish, Jonathan, LaBel, Kenneth. 2012-07-16. A Robust Strategy for Total Ionizing Dose Testing of Field Programmable Gate Arrays. https://ntrs.nasa.gov/citations/20120009206
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