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NASA NTRS · 20140005409

Single Event Testing on Complex Devices: Test Like You Fly versus Test-Specific Design Structures

Berg, Melanie·LaBel, Kenneth A.
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Abstract

We present a framework for evaluating complex digital systems targeted for harsh radiation environments such as space. Focus is limited to analyzing the single event upset (SEU) susceptibility of designs implemented inside Field Programmable Gate Array (FPGA) devices. Tradeoffs are provided between application-specific versus test-specific test structures.

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Single Event Upset TestingError Rate PredictionsField Programmable Gate Array (FPGA)

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BibTeXRIS

Berg, Melanie, LaBel, Kenneth A.. 2014-03-31. Single Event Testing on Complex Devices: Test Like You Fly versus Test-Specific Design Structures. https://ntrs.nasa.gov/citations/20140005409

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