Search NASA⌕ Search

NASA NTRS · 20140008976

Single Event Analysis and Fault Injection Techniques Targeting Complex Designs Implemented in Xilinx-Virtex Family Field Programmable Gate Array (FPGA) Devices

Abstract

An informative session regarding SRAM FPGA basics. Presenting a framework for fault injection techniques applied to Xilinx Field Programmable Gate Arrays (FPGAs). Introduce an overlooked time component that illustrates fault injection is impractical for most real designs as a stand-alone characterization tool. Demonstrate procedures that benefit from fault injection error analysis.

Explore related subjects

Keep this discovery

Explore connections, maps & timelines

BibTeXRIS

Berg, Melanie D., LaBel, Kenneth, Kim, Hak. 2014-05-19. Single Event Analysis and Fault Injection Techniques Targeting Complex Designs Implemented in Xilinx-Virtex Family Field Programmable Gate Array (FPGA) Devices. https://ntrs.nasa.gov/citations/20140008976

Cite the original work for its findings. Save a collection to share your selection of sources.

KEEP EXPLORING

Related reports

Independent Single Event Upset Testing of the Xilinx V5QV

In this presentation, we provide a brief glimpse at preliminary single event test results taken from two years of testing of the Xilinx V5QV Field Programmable Gate Array (FPGA). This presentation includes an overview of test philosophy and implementation.

Single Event Upset Testing↗