NASA NTRS · 20150007848
TID Test Results for 4th Generation iPad(TradeMark)
Abstract
TID testing of 4th generation iPads is reported. Of iPad subsystems, results indicate that the charging circuitry and display drivers fail at lowest TID levels. Details of construction are investigated for additional testing of components.
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Guertin, S. M., Allen, G. R., McClure, S. S., LaBel, K. A.. 2013-07-08. TID Test Results for 4th Generation iPad(TradeMark). https://ntrs.nasa.gov/citations/20150007848
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