NASA NTRS · 20150015964
Single Event Effects in FPGA Devices 2014-2015
Abstract
This presentation provides an overview of single event effects in FPGA devices 2014-2015 including commercial Xilinx V5 heavy ion accelerated testing, Xilinx Kintex-7 heavy ion accelerated testing. Mitigation study, and investigation of various types of triple modular redundancy (TMR) for commercial SRAM based FPGAs.
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Berg, Melanie D., LaBel, Kenneth A., Pellish, Jonathan. 2015-06-23. Single Event Effects in FPGA Devices 2014-2015. https://ntrs.nasa.gov/citations/20150015964
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