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NASA NTRS · 20190002701

A New Approach to System-Level Single Event Survivability Prediction

Berg, Melanie·LaBel, Kenneth·Campola, Michael·Xapsos, Michael
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Abstract

We are investigating the application of classical reliability performance metrics combined with standard single event upset (SEU) analysis data to improve system survivability prediction.

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Single event upset (SEU)Field programmable gate array (FPGA)NASA Electronic Parts and Packaging (NEPP) Program

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Berg, Melanie, LaBel, Kenneth, Campola, Michael, Xapsos, Michael. 2018-02-06. A New Approach to System-Level Single Event Survivability Prediction. https://ntrs.nasa.gov/citations/20190002701

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