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NASA NTRS · 20160009479

Single Event Effects in FPGA Devices 2015-2016

Berg, Melanie·LaBel, Kenneth·Pellish, Jonathan
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Abstract

This presentation provides an overview of single event effects in FPGA devices 2015-2016 including commercial Xilinx V5 heavy ion accelerated testing, Xilinx Kintex-7 heavy ion accelerated testing. Mitigation study, and investigation of various types of triple modular redundancy (TMR) for commercial SRAM based FPGAs.

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Single Event Upset (SEU) TestingXilinx Kintex-7Xilinx V5Single event latch-up (SEL)Single event upset (SEU)Virtex-5QVField Programmable Gate Array (FPGA)

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BibTeXRIS

Berg, Melanie, LaBel, Kenneth, Pellish, Jonathan. 2016-06-13. Single Event Effects in FPGA Devices 2015-2016. https://ntrs.nasa.gov/citations/20160009479

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