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NASA NTRS · 20170002637

Total Ionizing Dose Test Report for the UC1823A Pulse Width Modulator

Chen, Dakai·Forney, James
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Abstract

The purpose of this study is to examine the total ionizing dose susceptibility for the UC1823A pulse width modulator manufactured by Texas Instruments, Inc. The part is suspected to be vulnerable to enhanced low dose rate sensitivity (ELDRS).

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enhanced low dose rate sensitivity (ELDRSTotal Ionizing Dose (TID)

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BibTeXRIS

Chen, Dakai, Forney, James. 2017-03-27. Total Ionizing Dose Test Report for the UC1823A Pulse Width Modulator. https://ntrs.nasa.gov/citations/20170002637

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The purpose of this test was to characterize the flight lot of Texas Instruments' LM193 (flight part number is 5962-9452601Q2A) for total dose response. This test served as the radiation lot acceptance test (RLAT) for the lot date code (LDC) tested. Low dose rate (LDR) irradiations were performed in this test so that the device susceptibility to enhanced low dose rate sensitivity (ELDRS) was determined.

enhanced low dose rate sensitivity (ELDRS↗