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NASA NTRS · 20170011271

Current Status and Future Challenges in Risk-Based Radiation Engineering

Pellish, Jonathan A.
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Abstract

This presentation covers the basis and challenges for radiation effects in electronic systems. The three main types of radiation effects in electronics are: 1) total ionizing dose (TID), 2) total non-ionizing dose (TNID) / displacement damage dose (DDD), and 3) single-event effect (SEE). Some content on relevant examples of effects, current concerns, and possible environmental model-driven solutions are also included.

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Total Ionizing Dose (TID)Single-event effect (SEE)Displacement Damage Dose (DDD)

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Pellish, Jonathan A.. 2017-10-01. Current Status and Future Challenges in Risk-Based Radiation Engineering. https://ntrs.nasa.gov/citations/20170011271

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