NASA NTRS · 20190025929
Freeform Surface Characterization and Instrument Alignment for Freeform Space Applications
Abstract
CMM (Coordinate Measuring Machine) metrology provides simple, 3D (three dimensional) surface data used for prescription retrieval, figure error, and alignment with high accuracy without null-correctors. Two freeform mirrors for a compact telescope were successfully characterized and aligned using the CMM.
Explore related subjects
Keep this discovery
Explore connections, maps & timelines
Khreishi, Manal, Ohl, Raymond, Howard, Joseph, Papa, Jonathan, Hovis, Clark, Howe, Andrew, Hadjimichael, Theodore, Thompson, Patrick, Shiri, Ron, West, Garrett, Phenis, Adam, Liang, Rongguang. 2019-06-10. Freeform Surface Characterization and Instrument Alignment for Freeform Space Applications. https://ntrs.nasa.gov/citations/20190025929
Cite the original work for its findings. Save a collection to share your selection of sources.