NASA NTRS · 20200002147
Single Event Effect Testing of the Texas Instruments' MAX4595 Single-Channel Analog Switch
Abstract
The Texas Instruments'™ (TI) MAX4595 was tested for single event latch-up (SEL) response at the Texas A&M University Cyclotron Facility (TAMU) on 26 October 2014. The device was exercised in varied load conditions to replicate its intended application with concerns about destructive effects on the commercial device.
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Campola, M., Wilcox, T., Kim, H.. 2014-10-26. Single Event Effect Testing of the Texas Instruments' MAX4595 Single-Channel Analog Switch. https://ntrs.nasa.gov/citations/20200002147
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