NASA NTRS · 20205003346
Status of NEPP Radiation Testing 3D NAND Flash
Abstract
This work provides a current update of radiation testing activities on 3D NAND flash memories in support of the NEPP program. Single-event effects data from heavy-ion and low-energy proton testing is highlighted on a state of the art memory device.
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Ted Wilcox. 2020-06-17. Status of NEPP Radiation Testing 3D NAND Flash. https://ntrs.nasa.gov/citations/20205003346
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