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NASA NTRS · 20205004068

HSYE-117RH Voltage Linear Regulator Total Ionizing Dose Test Report

Megan Casey·Anthony Phan·Alyson Topper
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Abstract

The purpose of this test was to validate the Intersil HSYE-117RH-Q flight lot for use in the fabrication of Europa Clipper Propulsion subsystem flight hardware. This test shall serve as the radiation lot acceptance test (RLAT) for the flight lot date with wafer lot number G3X3CQC and lot date code (LDC) 1830. Low dose rate (LDR) irradiations have been performed by the manufacturer, but only to 100 krad(Si). This test determined the enhanced low dose rate sensitivity (ELDRS) of the device up to the mission specific dose of 125 krad(Si).

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Total Ionizing Dose (TID)Intersil HSYE-117RH-QLow dose rate (LDR)Enhanced Low Dose Rate Sensitivity (ELDRS)

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BibTeXRIS

Megan Casey, Anthony Phan, Alyson Topper. 2020-08-01. HSYE-117RH Voltage Linear Regulator Total Ionizing Dose Test Report. https://ntrs.nasa.gov/citations/20205004068

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