NASA NTRS · 20210002945
This paper summarizes single event upset and latchup data from 1996 to 1998 from numerous sources.
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Swift, G., Miyahira, T., Coss, J.. 1999-07-12. Device SEE Susceptibility Update: 1996-1998. https://ntrs.nasa.gov/citations/20210002945
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In this paper we report results of single-event tests of the PowerPC750 from Motorola and IBM, which are identical designs which are manufactured with advanced processes that uses a minimum feature size of 0.29 and 0.28 mu m, respectively.
In-flight data is examined showing a very high incidence of multiple-bit errors in a solid-state recorder that incorporates error detection and correction. The high MBU rate is shown to be a consequence of the physical selection of memory cell locations in the recorder architecture.
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