Single-event transients in high-speed comparators

Johnston, A. H.; Miyahira, T. F.; Irom, F.

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NASA NTRS · 20210005364

Single-event transients in high-speed comparators

Johnston, A. H.·Miyahira, T. F.·Irom, F.

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Abstract

Single-event transients are produced in linearintegrated circuits when they are exposed to heavy ions or protons, and those transients can be a significant problem for electronic circuits in spacecraft.

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space radiation micorelectronics single-event upset

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Johnston, A. H., Miyahira, T. F., Irom, F.. 2002-07-16. Single-event transients in high-speed comparators. https://ntrs.nasa.gov/citations/20210005364

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