NASA NTRS · 20210010506
The Future of Electronics Single Event Effects (SEE) Testing
Abstract
In this presentation, the driving factors changing the world of single-event effects (SEE) testing will be discussed. This includes both semiconductor technological advances and morphing space system philosophies. Considerations for meeting these new challenges will then follow.
Keep this discovery
Explore connections, maps & timelines
Kenneth A Label. 2021-03-16. The Future of Electronics Single Event Effects (SEE) Testing. https://ntrs.nasa.gov/citations/20210010506
Cite the original work for its findings. Save a collection to share your selection of sources.