NASA NTRS · 20230001253
MAX1340 12-Bit, Multichannel ADCs/DACs Single-Event Effects Characterization Test Report Using Heavy Ions
Abstract
This study is to characterize the destructive single event latchup (SEL) susceptibility of the MAX1340 analog/digital converter (ADC) or digital/analog converter (DAC). The device was monitored for SEL current events on the power supplies during exposure to a heavy ion beam at Lawrence Berkeley National Laboratory (LBNL) 88-inch Cyclotron.
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Thomas A. Carstens, Michael J. Campola, Anthony M. Phan, Hak S. Kim. 2023-02-01. MAX1340 12-Bit, Multichannel ADCs/DACs Single-Event Effects Characterization Test Report Using Heavy Ions. https://ntrs.nasa.gov/citations/20230001253
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