DOE OSTI · 1382014
X-ray diffraction microscopy of lithiated silicon microstructures
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Fister, Tim T., Goldman, Jason L., Long, Brandon R., Nuzzo, Ralph G., Gewirth, Andrew A., Fenter, Paul A.. 2013-04-01. X-ray diffraction microscopy of lithiated silicon microstructures. https://doi.org/10.1063/1.4798554
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